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Inorganic Chemicals, Metals & Advanced Materials

Crystal Optics & Photonics

Source 387 crystal optics & photonics for research, QC and production, documented with COA and SDS.

387products

3sub-categories

COA + SDSwith every lot

Optical Lenses & Prisms 106 Optical Windows & Coated Substrates 170 Laser Crystals, Mirrors, Filters & Wave Plates 111

Quartz window, dia x thickness 20 mm × 2.5 mm

Quartz window, dia x thickness 20 mm × 2.5 mm

Cat. No.: VQ-018083

VQ-018083

Right angle prism, 15 mm

Right angle prism, 15 mm

Cat. No.: VQ-017973

VQ-017973

Right angle prism, 16 mm

Right angle prism, 16 mm

Cat. No.: VQ-017974

VQ-017974

Right angle prism, 25 mm

Right angle prism, 25 mm

Cat. No.: VQ-017975

VQ-017975

Right angle prism, 40 mm

Right angle prism, 40 mm

Cat. No.: VQ-017976

VQ-017976

Right angle prism, 50 mm

Right angle prism, 50 mm

Cat. No.: VQ-017977

VQ-017977

Right Angle prism, 70 mm

Right Angle prism, 70 mm

Cat. No.: VQ-017978

VQ-017978

Puriss

Round Protected Silver Mirrors

Round Protected Silver Mirrors

Cat. No.: VQ-018236

VQ-018236

Puriss

Round Ultrabroadband Dielectric Mirrors

Round Ultrabroadband Dielectric Mirrors

Cat. No.: VQ-018237

VQ-018237

Sapphire single crystal wafer, C-plane, dia. x thickness 100 mm x 1 mm

Sapphire single crystal wafer, C-plane, dia. x thickness 100 mm x 1 mm

Cat. No.: VQ-018084

VQ-018084

Sapphire substrate, 10 mm x 10 mm, thick 0.5 mm {C-axis (0001)}

Sapphire substrate, 10 mm x 10 mm, thick 0.5 mm {C-axis (0001)}

Cat. No.: VQ-018085

VQ-018085

Sapphire substrate, diam. x thickness 4 in x 0.65 mm

Sapphire substrate, diam. x thickness 4 in x 0.65 mm

Cat. No.: VQ-018086

VQ-018086

Sapphire Wafer, C-plane (0001), diam. x thickness 4 inch x 0.65 mm

Sapphire Wafer, C-plane (0001), diam. x thickness 4 inch x 0.65 mm

Cat. No.: VQ-018087

VQ-018087

Sapphire wafer, R-plane (1-102), L × W × thickness 10 mm × 10 mm × 0.5 mm

Sapphire wafer, R-plane (1-102), L × W × thickness 10 mm × 10 mm × 0.5 mm

Cat. No.: VQ-018088

VQ-018088

Sapphire wafers, dia. x thickness 100 mm x 0.5 mm

Sapphire wafers, dia. x thickness 100 mm x 0.5 mm

Cat. No.: VQ-018089

VQ-018089

Shearing Interferometers

Shearing Interferometers

Cat. No.: VQ-017979

VQ-017979

SI wafers, P-type, dia 4 inch, thick 0.525 mm [Thermal oxide wafer 300 nm SiO2 layer on Si (100)]

SI wafers, P-type, dia 4 inch, thick 0.525 mm [Thermal oxide wafer 300 nm SiO2 layer on Si (100)]

Cat. No.: VQ-018090

VQ-018090

Spectroscopy

Silica substrates fused, UV grade, 25 mm dia, 1 mm thick

Silica substrates fused, UV grade, 25 mm dia, 1 mm thick

Cat. No.: VQ-018091

VQ-018091

Spectroscopy

Silica substrates fused, UV grade, 50 mm dia, 2 mm thick

Silica substrates fused, UV grade, 50 mm dia, 2 mm thick

Cat. No.: VQ-018092

VQ-018092

Silicon optical (mono crystalline) windows, 170 mm dia, 25 mm thick, 99.999%

Silicon optical (mono crystalline) windows, 170 mm dia, 25 mm thick, 99.999%

CAS: 7440-21-3
Formula: Si
MW: 28.09 g/mol

VQ-018093

Silicon optical (mono crystalline) windows, 25 mm dia, 3 mm thick, 99.999%

Silicon optical (mono crystalline) windows, 25 mm dia, 3 mm thick, 99.999%

CAS: 7440-21-3
Formula: Si
MW: 28.09 g/mol

VQ-018094

Silicon optical (mono crystalline) windows, 30 mm dia, 10 mm thick, 99.999%

Silicon optical (mono crystalline) windows, 30 mm dia, 10 mm thick, 99.999%

CAS: 7440-21-3
Formula: Si
MW: 28.09 g/mol

VQ-018095

Silicon optical (mono crystalline) windows, 30 mm dia, 15 mm thick, 99.999%

Silicon optical (mono crystalline) windows, 30 mm dia, 15 mm thick, 99.999%

CAS: 7440-21-3
Formula: Si
MW: 28.09 g/mol

VQ-018096

Silicon optical (mono crystalline) windows, 40 mm dia, 10 mm thick, 99.999%

Silicon optical (mono crystalline) windows, 40 mm dia, 10 mm thick, 99.999%

CAS: 7440-21-3
Formula: Si
MW: 28.09 g/mol

VQ-018097

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